Institute of Physics of Materials AS CR, v. v. i. > Groups > Electron Microscopy and advanced analysis of materials
Talos™ F200i transmission electron microscope
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscope
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
JEOL JSM-6460 scanning electron microscope
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JSM-6460 scanning electron microscope with tungsten electron source.
MightyEBIC 2.0 (Ephemeron Labs)
Contact person: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Sputter coater Quorum 150T
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The Q150T system is a versatile turbo sputter for preparing samples for observation in a scanning electron microscope.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIB
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
Grinding & Polishing Machine Minitech SP1 300 Presi
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Manual single-disk grinder and polisher with a disk diameter of 300 mm, designed for grinding samples on sandpaper, disks, or for polishing samples using polishing cloths and diamond pastes and suspensions.
SPM LiteScope (NenoVision)
Contact person: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
Stereomicroskope Olympus SZX7
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Compact stereomicroscope with integrated camera and mechanized z-axis movement.
TenuPol 5
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
TenuPol-5 is a device designed for automated electropolishing and etching of metallographic samples for observation in a transmission electron microscope.
OPAL 410 Hot Mounting Press ATM
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Fully automatic Opal 410 hot mounting metallographic press with an electro-hydraulic system and an included cooling system for automatic specimen cooling is used for the preparation of metallographic specimens.
Brillant 220 automatic / manual metallographic saw Metalco
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Brillant-220 is an universal precision saw designed for manual and automatic precision cutting of very small and larger specimens.
Digital microscope Olympus DSX1000
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The Olympus DSX1000 digital microscope enables recording of 2D / 3D images using long working distance objective lenses.
GW INSTEK PSU 60-25 programmable laboratory power supply
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
GW INSTEK PSU 60-25 DC switching laboratory power supply is a programmable power supply with an output voltage of 0-60 V and a maximum output current of 25 A.
Olympus GX51 Inverted Metallographic Microscope
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The GX51 inverted microscope provides high stability to support excellent image clarity and superb resolution with high magnifications and comfortable operability.
Duramin microhardness tester Struers
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Duramin microhardness tester for Vickers and Knoop hardness tests performed in a range of loads from 98.07 mN (10 g) to 19.61 N (2 kg).
Precision Ion Polishing System (PIPS) Gatan MODEL 691
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The System for TEM samples preparation by argon ions polishing
Precision Ion Polishing System (PIPS II), Gatan MODEL 695
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The instrument designed to produce high-quality TEM specimens by argon ions polishing.
Cross Section Polisher SM-09010, JEOL
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.
Saphir 320 and 330 Grinding & Polishing Machines ATM
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Single/double wheel manual grinders and polishers are used for specimens grinding on grinding papers/discs and polishing on polishing clothes with diamond pastes or suspensions.
Saphir 550 automatic grinder and polisher with Rubin 520 grinding unit Metalco
Contact person:
Saphir 550 automatic single-disc preparation system with 300 mm disk is designed for grinding and polishing of metallographic specimens.
Stereomicroscope Leica S9i
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Compact stereomicroscope with an optical system with 12° scattering optical paths and and apochromatic optics incorporated in the microscope and an integrated camera.
Tergeo plasma cleaner
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Compact cleaner designed for SEM specimen cleaning, activating functional groups on polymers, metals, and ceramics, achieving hydrophilic wettability, improving bonding strength and printability, etc.
Thermostat Lauda RP 290 E
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Lauda RP 290 E circulation thermostat is designed for external applications where rapid temperature changes are required (e.g. electrolyte cooling).
DuraScan 70 G5 ZwickRoell hardness tester
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The DuraScan 70 G5 hardness tester enables measurements using the Vickers method in the load range from 0.01 to 60 kg.
ZHV30 Vickers Hardness Tester ZwickRoell
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The ZHV30 low-load Vickers hardness tester used for hardness tests according to ISO 6507 and ASTM E384 in the test-load range from HV0.2 to HV30.
Rockwell 150CLK ZwickRoell universal hardness tester
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The Rockwell 150CLK universal hardness tester enables hardness measurements in the range of 5 to 187.5 kg.
VibroMet 2 Vibratory Polisher Buehler
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
VibroMet 2 Vibratory Polisher is designed to prepare high quality polished surfaces on a wide variety of problematically polished materials (such as soft materials, superalloys, microelectronic parts, etc.).
LectroPol-5 electrolytic polishing machine
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
LectroPol-5 is designed for automatized electrolytic polishing and etching of metallographic specimens.
MATRIX MPS-7061 60V/10A power supply
Contact person: doc. Ing. Stanislava Fintová, Ph.D.
DC regulated power supply of constant voltage or current is used for electrolytic polishing and etching.
Nic nebylo nalezeno / nothing found
SELECT p.* FROM papers as p, xauthors as x, xgroups as xg WHERE xg.id_author=x.id_author AND p.id=x.id_paper and xg.id_group=10 GROUP BY id, title ORDER BY p.year DESC limit 0,100
Electron Microscopy and advanced analysis of materials
| Head | doc. Ing. Stanislava Fintová, Ph.D. |
| [javascript protected email address] | |
| Phone number | +420 532 290 301 |
| Room | 317 |
The EM group takes care of the operation and maintenance of electron microscopes, the development of microscopic techniques and their successful applications for solving the research tasks. The group covers top quality transmission electron microscopy (TEM) specimen preparation by various techniques.
Secondary and backscattered electrons are used for basic imagining in scanning electron microscopes (SEM). Moreover, SEMs are equipped with various detectors. EDS or WDS detectors are used for chemical analysis and EBSD detector plays a key role in phase or texture analysis. Two focused ion columns (FIB) together with a gas injection system offer other possibilities. Ga ions can be used for imagining and deposition of thin layers or micromachining on the microscale. The FIB technique is, for example, frequently used for site-specific TEM specimen preparation.
Two TEMs with the atomic resolution are present at IPM. TEMs might be operated in standard TEM mode as well as in scanning mode (STEM). STEM using bright field and high angle angular dark field detector is an unreplaceable method in microstructural analysis. Both TEMs are equipped with EDS detectors for chemical analysis on a nanometric level. One TEM is equipped with a Lorentz lens and biprism for holography.
Members of the group are capable of specimen preparation and microstructure documentation and data processing and analysis via appropriate software. The members keep cooperating with companies producing microscopes on the development of advanced microscopic techniques and their modification for specific needs of the research taking place at IPM. The group belongs to an infrastructural part of the department of Experimental Studies and Modelling of Structure.
The laboratory focuses on the preparation of nano to macro particle precursors for newly developing materials. Apart from the preparation of new materials, the Laboratory offers an analysis of a wide range of materials via light optical microscopy and selective/color etching. Another field of expertise is the preparation of a top quality surface for EBSD and AFM analysis, defect-free complex surfaces preparation via electrolytic and chemical polishing and hardness measurement.
Secondary and backscattered electrons are used for basic imagining in scanning electron microscopes (SEM). Moreover, SEMs are equipped with various detectors. EDS or WDS detectors are used for chemical analysis and EBSD detector plays a key role in phase or texture analysis. Two focused ion columns (FIB) together with a gas injection system offer other possibilities. Ga ions can be used for imagining and deposition of thin layers or micromachining on the microscale. The FIB technique is, for example, frequently used for site-specific TEM specimen preparation.
Two TEMs with the atomic resolution are present at IPM. TEMs might be operated in standard TEM mode as well as in scanning mode (STEM). STEM using bright field and high angle angular dark field detector is an unreplaceable method in microstructural analysis. Both TEMs are equipped with EDS detectors for chemical analysis on a nanometric level. One TEM is equipped with a Lorentz lens and biprism for holography.
Members of the group are capable of specimen preparation and microstructure documentation and data processing and analysis via appropriate software. The members keep cooperating with companies producing microscopes on the development of advanced microscopic techniques and their modification for specific needs of the research taking place at IPM. The group belongs to an infrastructural part of the department of Experimental Studies and Modelling of Structure.
The laboratory focuses on the preparation of nano to macro particle precursors for newly developing materials. Apart from the preparation of new materials, the Laboratory offers an analysis of a wide range of materials via light optical microscopy and selective/color etching. Another field of expertise is the preparation of a top quality surface for EBSD and AFM analysis, defect-free complex surfaces preparation via electrolytic and chemical polishing and hardness measurement.
Technicians
| Name | Phone numbers | Rooms | |
|---|---|---|---|
| Ing. Denisa Beranová | +420 532 290 712 | EM 2.06 | [javascript protected email address] |
| Ing. Dagmar Herzánová | +420 532 290 714 | EM 2.08 | [javascript protected email address] |
| Ing. Vít Horník, Ph.D. | +420 532 290 713 | EM 2.07 | [javascript protected email address] |
| Ing. Zdeněk Jakůbek | +420 532 290 712 | EM 2.06 | [javascript protected email address] |
| Ing. Ivana Podstranská | +420 532 290 713 | EM 2.07 | [javascript protected email address] |
| Ing. Peter Smatana | +420 532 290 714 | EM 2.08 | [javascript protected email address] |
| Project number | Name | Investigator |
|---|---|---|
| 13-28685P | Identification of fatigue damage mechanisms in modern steels under development for fusion and nuclear reactors | Ing. Ivo Kuběna, Ph.D. |
Talos™ F200i transmission electron microscopeContact person: doc. Ing. Stanislava Fintová, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscopeContact person: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
JEOL JSM-6460 scanning electron microscopeContact person: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JSM-6460 scanning electron microscope with tungsten electron source.
MightyEBIC 2.0 (Ephemeron Labs)Contact person: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Sputter coater Quorum 150TContact person: doc. Ing. Stanislava Fintová, Ph.D.
The Q150T system is a versatile turbo sputter for preparing samples for observation in a scanning electron microscope.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIBContact person: doc. Ing. Stanislava Fintová, Ph.D.
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIBContact person: doc. Ing. Stanislava Fintová, Ph.D.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
Grinding & Polishing Machine Minitech SP1 300 PresiContact person: doc. Ing. Stanislava Fintová, Ph.D.
Manual single-disk grinder and polisher with a disk diameter of 300 mm, designed for grinding samples on sandpaper, disks, or for polishing samples using polishing cloths and diamond pastes and suspensions.
SPM LiteScope (NenoVision)Contact person: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
Stereomicroskope Olympus SZX7Contact person: doc. Ing. Stanislava Fintová, Ph.D.
Compact stereomicroscope with integrated camera and mechanized z-axis movement.
TenuPol 5Contact person: doc. Ing. Stanislava Fintová, Ph.D.
TenuPol-5 is a device designed for automated electropolishing and etching of metallographic samples for observation in a transmission electron microscope.
OPAL 410 Hot Mounting Press ATMContact person: doc. Ing. Stanislava Fintová, Ph.D.
Fully automatic Opal 410 hot mounting metallographic press with an electro-hydraulic system and an included cooling system for automatic specimen cooling is used for the preparation of metallographic specimens.
Brillant 220 automatic / manual metallographic saw MetalcoContact person: doc. Ing. Stanislava Fintová, Ph.D.
Brillant-220 is an universal precision saw designed for manual and automatic precision cutting of very small and larger specimens.
Digital microscope Olympus DSX1000Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The Olympus DSX1000 digital microscope enables recording of 2D / 3D images using long working distance objective lenses.
GW INSTEK PSU 60-25 programmable laboratory power supplyContact person: doc. Ing. Stanislava Fintová, Ph.D.
GW INSTEK PSU 60-25 DC switching laboratory power supply is a programmable power supply with an output voltage of 0-60 V and a maximum output current of 25 A.
Olympus GX51 Inverted Metallographic MicroscopeContact person: doc. Ing. Stanislava Fintová, Ph.D.
The GX51 inverted microscope provides high stability to support excellent image clarity and superb resolution with high magnifications and comfortable operability.
Duramin microhardness tester StruersContact person: doc. Ing. Stanislava Fintová, Ph.D.
Duramin microhardness tester for Vickers and Knoop hardness tests performed in a range of loads from 98.07 mN (10 g) to 19.61 N (2 kg).
Precision Ion Polishing System (PIPS) Gatan MODEL 691Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The System for TEM samples preparation by argon ions polishing
Precision Ion Polishing System (PIPS II), Gatan MODEL 695Contact person: doc. Ing. Stanislava Fintová, Ph.D.
The instrument designed to produce high-quality TEM specimens by argon ions polishing.
Cross Section Polisher SM-09010, JEOLContact person: doc. Ing. Stanislava Fintová, Ph.D.
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.
Saphir 320 and 330 Grinding & Polishing Machines ATMContact person: doc. Ing. Stanislava Fintová, Ph.D.
Single/double wheel manual grinders and polishers are used for specimens grinding on grinding papers/discs and polishing on polishing clothes with diamond pastes or suspensions.
Saphir 550 automatic grinder and polisher with Rubin 520 grinding unit MetalcoContact person:
Saphir 550 automatic single-disc preparation system with 300 mm disk is designed for grinding and polishing of metallographic specimens.
Stereomicroscope Leica S9iContact person: doc. Ing. Stanislava Fintová, Ph.D.
Compact stereomicroscope with an optical system with 12° scattering optical paths and and apochromatic optics incorporated in the microscope and an integrated camera.
Tergeo plasma cleanerContact person: doc. Ing. Stanislava Fintová, Ph.D.
Compact cleaner designed for SEM specimen cleaning, activating functional groups on polymers, metals, and ceramics, achieving hydrophilic wettability, improving bonding strength and printability, etc.
Thermostat Lauda RP 290 EContact person: doc. Ing. Stanislava Fintová, Ph.D.
Lauda RP 290 E circulation thermostat is designed for external applications where rapid temperature changes are required (e.g. electrolyte cooling).
DuraScan 70 G5 ZwickRoell hardness testerContact person: doc. Ing. Stanislava Fintová, Ph.D.
The DuraScan 70 G5 hardness tester enables measurements using the Vickers method in the load range from 0.01 to 60 kg.
ZHV30 Vickers Hardness Tester ZwickRoellContact person: doc. Ing. Stanislava Fintová, Ph.D.
The ZHV30 low-load Vickers hardness tester used for hardness tests according to ISO 6507 and ASTM E384 in the test-load range from HV0.2 to HV30.
Rockwell 150CLK ZwickRoell universal hardness testerContact person: doc. Ing. Stanislava Fintová, Ph.D.
The Rockwell 150CLK universal hardness tester enables hardness measurements in the range of 5 to 187.5 kg.
VibroMet 2 Vibratory Polisher BuehlerContact person: doc. Ing. Stanislava Fintová, Ph.D.
VibroMet 2 Vibratory Polisher is designed to prepare high quality polished surfaces on a wide variety of problematically polished materials (such as soft materials, superalloys, microelectronic parts, etc.).
LectroPol-5 electrolytic polishing machineContact person: doc. Ing. Stanislava Fintová, Ph.D.
LectroPol-5 is designed for automatized electrolytic polishing and etching of metallographic specimens.
MATRIX MPS-7061 60V/10A power supplyContact person: doc. Ing. Stanislava Fintová, Ph.D.
DC regulated power supply of constant voltage or current is used for electrolytic polishing and etching.
Nic nebylo nalezeno / nothing found
SELECT p.* FROM papers as p, xauthors as x, xgroups as xg WHERE xg.id_author=x.id_author AND p.id=x.id_paper and xg.id_group=10 GROUP BY id, title ORDER BY p.year DESC limit 0,100
