Institute of Physics of Materials AS CR, v. v. i. > Groups > Electron Microscopy

Electron Microscopy

HeadIng. Ivo Kuběna, Ph.D.
E-mail [javascript protected email address]
Phone number+420 532 290 417
Room316

The EM group takes care of the operation and maintenance of electron microscopes, the development of microscopic techniques and their successful applications for solving the research tasks. The group covers top quality transmission electron microscopy (TEM) specimen preparation by various techniques.
Secondary and backscattered electrons are used for basic imagining in scanning electron microscopes (SEM). Moreover, SEMs are equipped with various detectors. EDS or WDS detectors are used for chemical analysis and EBSD detector plays a key role in phase or texture analysis. Two focused ion columns (FIB) together with a gas injection system offer other possibilities. Ga ions can be used for imagining and deposition of thin layers or micromachining on the microscale. The FIB technique is, for example, frequently used for site-specific TEM specimen preparation.
Two TEMs with the atomic resolution are present at IPM. TEMs might be operated in standard TEM mode as well as in scanning mode (STEM). STEM using bright field and high angle angular dark field detector is an unreplaceable method in microstructural analysis. Both TEMs are equipped with EDS detectors for chemical analysis on a nanometric level. One TEM is equipped with a Lorentz lens and biprism for holography.
Members of the group are capable of specimen preparation and microstructure documentation and data processing and analysis via appropriate software. The members keep cooperating with companies producing microscopes on the development of advanced microscopic techniques and their modification for specific needs of the research taking place at IPM. The group belongs to an infrastructural part of the department of Experimental Studies and Modelling of Structure.

Technicians


NamePhone numbersRoomsE-mail
Ing. Dagmar Herzánová +420 532 290 482408 [javascript protected email address]
Daniel Jadlovský +420 532 290 390 [javascript protected email address]
Ing. Ivana Podstranská +420 532 290 481407 [javascript protected email address]
Jan Procházka +420 532 290 390 [javascript protected email address]
Ing. Peter Smatana +420 532 290 432323 [javascript protected email address]


Project numberNameInvestigator
13-28685P Identification of fatigue damage mechanisms in modern steels under development for fusion and nuclear reactorsIng. Ivo Kuběna, Ph.D.

ALL PROJECTS

Transmission electron microscope JEOL JEM-2100F

Contact person: Ing. Ivo Kuběna, Ph.D.
High resolution transmission electron microscope JEOL JEM-2100F with FEG electron source.

Transmission electron microscope Philips CM12 STEM

Contact person: Ing. Ivo Kuběna, Ph.D.
Analytical transmission electron microscope Philips CM12 STEM with thermoemission source of electrons.

MightyEBIC 2.0 (Ephemeron Labs)

Contact person: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.

Scanning electron microscope Tescan LYRA 3 XMH FEG/SEM

Contact person: Ing. Ivana Podstranská
Scanning electron microscope with FEG electron source.

Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB

Contact person: Ing. Ivana Podstranská
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.

SPM LiteScope (NenoVision)

Contact person: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.

Precision Ion Polishing System (PIPS) Gatan MODEL 691

Contact person: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing

Precision Ion Polishing System (PIPS II), Gatan MODEL 695

Contact person: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.

Cross Section Polisher SM-09010, JEOL

Contact person: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.


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