Institute of Physics of Materials AS CR, v. v. i. > Groups > Electron Microscopy

Electron Microscopy

HeadIng. Ivo Kuběna, Ph.D.
E-mail [javascript protected email address]
Phone number+420 532 290 417
Room316

The group takes care of the operation of electron microscopes, the development of microscopic techniques and their successful applications for solving the research tasks of the researchers of the IPM.

Technicians


NamePhone numbersRoomsE-mail
Ing. Dagmar Herzánová +420 532 290 482408 [javascript protected email address]
Ing. Ivana Podstranská +420 532 290 481407 [javascript protected email address]
Ing. Peter Smatana +420 532 290 432323 [javascript protected email address]

Diploma students


NamePhone numbersRoomsE-mail
Bc. Lucius Fridrich +420 532 290


Project numberNameInvestigator
13-28685P Identification of fatigue damage mechanisms in modern steels under development for fusion and nuclear reactorsIng. Ivo Kuběna, Ph.D.

ALL PROJECTS

Transmission electron microscope JEOL JEM-2100F

Contact person: Ing. Ivo Kuběna, Ph.D.
High resolution transmission electron microscope JEOL JEM-2100F with FEG electron source.

Transmission electron microscope Philips CM12 STEM

Contact person: Ing. Ivo Kuběna, Ph.D.
Analytical transmission electron microscope Philips CM12 STEM with thermoemission source of electrons.

MightyEBIC 2.0 (Ephemeron Labs)

Contact person: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.

Scanning electron microscope Tescan LYRA 3 XMH FEG/SEM

Contact person: Ing. Ivana Podstranská
Scanning electron microscope with FEG electron source.

Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB

Contact person: Ing. Ivana Podstranská
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.

SPM LiteScope (NenoVision)

Contact person: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.

Precision Ion Polishing System (PIPS) Gatan MODEL 691

Contact person: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing

Precision Ion Polishing System (PIPS II), Gatan MODEL 695

Contact person: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.

Cross Section Polisher SM-09010, JEOL

Contact person: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.


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