Institute of Physics of Materials AS CR, v. v. i. > List of facilities > JEOL JEM-2100F transmission electron microscope
JEOL JEM-2100F transmission electron microscope
|Contact||Ing. Ivo Kuběna, Ph.D.|
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
FEG producing highly stable and bright electron probe is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. The microscope is equipped by EDS detector for X-ray microanalysis with analytical system Aztec, HAADF and BF detectors for STEM mode, 8Mpix camera by Gatan and software Digital Micrograph. Single tilt and double tilt holders can be used for specimens analysis. Techniques: TEM, HRTEM, SAED, CBD, NBD, STEM, EDS