Institute of Physics of Materials AS CR, v. v. i. > List of facilities > JEOL JEM-2100F transmission electron microscope

JEOL JEM-2100F transmission electron microscope

JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).

JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG) producing highly stable and bright electron probe, essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled samples. The microscope is equipped by EDS detector for X-ray microanalysis with analytical system Aztec, HAADF and BF detectors for STEM, 8Mpix camera by Gatan and software Digital Micrograph. Single tilt and double tilt holders can be used for specimens analysis.   Techniques: TEM, HRTEM, SAED, CBD, NBD, STEM, EDS