Institute of Physics of Materials AS CR, v. v. i. > Laboratories > Electron Microscopy

Electron Microscopy


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Transmission electron microscope JEOL JEM-2100F

Contact: Ing. Ivo Kuběna, Ph.D.
High resolution transmission electron microscope JEOL JEM-2100F with FEG electron source.

Transmission electron microscope Philips CM12 STEM

Contact: Ing. Ivo Kuběna, Ph.D.
Analytical transmission electron microscope Philips CM12 STEM with thermoemission source of electrons.

MightyEBIC 2.0 (Ephemeron Labs)

Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.

Scanning electron microscope Tescan LYRA 3 XMH FEG/SEM

Contact: Ing. Ivana Podstranská
Scanning electron microscope with FEG electron source.

Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB

Contact: Ing. Ivana Podstranská
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.

SPM LiteScope (NenoVision)

Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.

Precision Ion Polishing System (PIPS) Gatan MODEL 691

Contact: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing

Precision Ion Polishing System (PIPS II), Gatan MODEL 695

Contact: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.

Cross Section Polisher SM-09010, JEOL

Contact: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.