Institute of Physics of Materials AS CR, v. v. i. > Laboratories > Electron Microscopy
Talos™ F200i transmission electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
JEOL JSM-6460 scanning electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JSM-6460 scanning electron microscope with tungsten electron source.
MightyEBIC 2.0 (Ephemeron Labs)
Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIB
Contact: doc. Ing. Stanislava Fintová, Ph.D.
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB
Contact: doc. Ing. Stanislava Fintová, Ph.D.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
SPM LiteScope (NenoVision)
Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
Electron Microscopy
Virtual tourTake a Tour |
Talos™ F200i transmission electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
JEOL JSM-6460 scanning electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JSM-6460 scanning electron microscope with tungsten electron source.
MightyEBIC 2.0 (Ephemeron Labs)Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIBContact: doc. Ing. Stanislava Fintová, Ph.D.
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIBContact: doc. Ing. Stanislava Fintová, Ph.D.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
SPM LiteScope (NenoVision)Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
