Institute of Physics of Materials AS CR, v. v. i. > Laboratories > Electron Microscopy
Talos™ F200i transmission electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
Apreo ChemiSEM with FEG electron source - Scanning electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
Thermo Scientific ChemiSEM system is equiped by in-lens and in-column detectors, hybrid pixelated Direct Electron Detection EBSD system based on Timepix technology and advanced EDS detector with ChemiPhase enabling accurate identification of material phases with pixel-perfect precision.
Scios2 DualBeam with FEG electron source and FIB - Scanning electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
The Thermo ScientificTM Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB
Contact: doc. Ing. Stanislava Fintová, Ph.D.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIB
Contact: doc. Ing. Stanislava Fintová, Ph.D.
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
JEOL JSM-6460 scanning electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JSM-6460 scanning electron microscope with tungsten electron source.
MightyEBIC 2.0 (Ephemeron Labs)
Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
SPM LiteScope (NenoVision)
Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
Electron Microscopy
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Talos™ F200i transmission electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
Apreo ChemiSEM with FEG electron source - Scanning electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
Thermo Scientific ChemiSEM system is equiped by in-lens and in-column detectors, hybrid pixelated Direct Electron Detection EBSD system based on Timepix technology and advanced EDS detector with ChemiPhase enabling accurate identification of material phases with pixel-perfect precision.
Scios2 DualBeam with FEG electron source and FIB - Scanning electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
The Thermo ScientificTM Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIBContact: doc. Ing. Stanislava Fintová, Ph.D.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIBContact: doc. Ing. Stanislava Fintová, Ph.D.
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
JEOL JSM-6460 scanning electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JSM-6460 scanning electron microscope with tungsten electron source.
MightyEBIC 2.0 (Ephemeron Labs)Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
SPM LiteScope (NenoVision)Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
