Institute of Physics of Materials AS CR, v. v. i. > Laboratories > Electron Microscopy
Talos™ F200i transmission electron microscope
Contact: Ing. Ivo Kuběna, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscope
Contact: Ing. Ivo Kuběna, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
JEOL JSM-6460 scanning electron microscope
Contact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JSM-6460 scanning electron microscope with tungsten electron source.
MightyEBIC 2.0 (Ephemeron Labs)
Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Sputter coater Quorum 150T
Contact: Ing. Peter Smatana
The Q150T system is a versatile turbo sputter for preparing samples for observation in a scanning electron microscope.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIB
Contact: doc. Ing. Stanislava Fintová, Ph.D.
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB
Contact: doc. Ing. Stanislava Fintová, Ph.D.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
SPM LiteScope (NenoVision)
Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
TenuPol 5
Contact: Ing. Peter Smatana
TenuPol-5 is a device designed for automated electropolishing and etching of metallographic samples for observation in a transmission electron microscope.
Precision Ion Polishing System (PIPS) Gatan MODEL 691
Contact: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing
Precision Ion Polishing System (PIPS II), Gatan MODEL 695
Contact: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.
Cross Section Polisher SM-09010, JEOL
Contact: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.
Electron Microscopy
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Talos™ F200i transmission electron microscopeContact: Ing. Ivo Kuběna, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscopeContact: Ing. Ivo Kuběna, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
JEOL JSM-6460 scanning electron microscopeContact: doc. Ing. Stanislava Fintová, Ph.D.
JEOL JSM-6460 scanning electron microscope with tungsten electron source.
MightyEBIC 2.0 (Ephemeron Labs)Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Sputter coater Quorum 150TContact: Ing. Peter Smatana
The Q150T system is a versatile turbo sputter for preparing samples for observation in a scanning electron microscope.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIBContact: doc. Ing. Stanislava Fintová, Ph.D.
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIBContact: doc. Ing. Stanislava Fintová, Ph.D.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
SPM LiteScope (NenoVision)Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
TenuPol 5Contact: Ing. Peter Smatana
TenuPol-5 is a device designed for automated electropolishing and etching of metallographic samples for observation in a transmission electron microscope.
Precision Ion Polishing System (PIPS) Gatan MODEL 691Contact: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing
Precision Ion Polishing System (PIPS II), Gatan MODEL 695Contact: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.
Cross Section Polisher SM-09010, JEOLContact: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.
