Institute of Physics of Materials AS CR, v. v. i. > Laboratories > Electron Microscopy
Transmission electron microscope JEOL JEM-2100F
Contact: Ing. Ivo Kuběna, Ph.D.
High resolution transmission electron microscope JEOL JEM-2100F with FEG electron source.
Transmission electron microscope Philips CM12 STEM
Contact: Ing. Ivo Kuběna, Ph.D.
Analytical transmission electron microscope Philips CM12 STEM with thermoemission source of electrons.
MightyEBIC 2.0 (Ephemeron Labs)
Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEM
Contact: Ing. Ivana Podstranská
Scanning electron microscope with FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB
Contact: Ing. Ivana Podstranská
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
SPM LiteScope (NenoVision)
Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
Precision Ion Polishing System (PIPS) Gatan MODEL 691
Contact: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing
Precision Ion Polishing System (PIPS II), Gatan MODEL 695
Contact: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.
Cross Section Polisher SM-09010, JEOL
Contact: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.
Electron Microscopy
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Transmission electron microscope JEOL JEM-2100FContact: Ing. Ivo Kuběna, Ph.D.
High resolution transmission electron microscope JEOL JEM-2100F with FEG electron source.
Transmission electron microscope Philips CM12 STEMContact: Ing. Ivo Kuběna, Ph.D.
Analytical transmission electron microscope Philips CM12 STEM with thermoemission source of electrons.
MightyEBIC 2.0 (Ephemeron Labs)Contact: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMContact: Ing. Ivana Podstranská
Scanning electron microscope with FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIBContact: Ing. Ivana Podstranská
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
SPM LiteScope (NenoVision)Contact: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
Precision Ion Polishing System (PIPS) Gatan MODEL 691Contact: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing
Precision Ion Polishing System (PIPS II), Gatan MODEL 695Contact: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.
Cross Section Polisher SM-09010, JEOLContact: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.