Institute of Physics of Materials AS CR, v. v. i. > List of facilities > JEOL JSM-6460 scanning electron microscope
JEOL JSM-6460 scanning electron microscope
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JEOL JSM-6460 scanning electron microscope with tungsten electron source.
The microscope is equipped with EDS X-MAX80, EBSD Nordlys, VDS detectors and AZtec and Inca software. Techniques: SE, BSE, EDS, VDS, EBSD