Institute of Physics of Materials AS CR, v. v. i. > List of facilities > JEOL JSM-6460 scanning electron microscope

JEOL JSM-6460 scanning electron microscope

JEOL JSM-6460 scanning electron microscope with tungsten electron source.

The microscope is equipped with EDS X-MAX80, EBSD Nordlys, VDS detectors and AZtec and Inca software. Techniques: SE, BSE, EDS, VDS, EBSD