Elektronová mikroskopie

Skupina se stará o chod elektronových mikroskpů, rozvoj mikroskopických technik a jejich úspěšné aplikace pro řešení výzkumných cílů pracovníků ÚFM.

The EM group takes care of the operation and maintenance of electron microscopes, the development of microscopic techniques and their successful applications for solving the research tasks. The group covers top quality transmission electron microscopy (TEM) specimen preparation by various techniques.
Secondary and backscattered electrons are used for basic imagining in scanning electron microscopes (SEM). Moreover, SEMs are equipped with various detectors. EDS or WDS detectors are used for chemical analysis and EBSD detector plays a key role in phase or texture analysis. Two focused ion columns (FIB) together with a gas injection system offer other possibilities. Ga ions can be used for imagining and deposition of thin layers or micromachining on the microscale. The FIB technique is, for example, frequently used for site-specific TEM specimen preparation.
Two TEMs with the atomic resolution are present at IPM. TEMs might be operated in standard TEM mode as well as in scanning mode (STEM). STEM using bright field and high angle angular dark field detector is an unreplaceable method in microstructural analysis. Both TEMs are equipped with EDS detectors for chemical analysis on a nanometric level. One TEM is equipped with a Lorentz lens and biprism for holography.
Members of the group are capable of specimen preparation and microstructure documentation and data processing and analysis via appropriate software. The members keep cooperating with companies producing microscopes on the development of advanced microscopic techniques and their modification for specific needs of the research taking place at IPM. The group belongs to an infrastructural part of the department of Experimental Studies and Modelling of Structure.

Techničtí pracovníci

Jméno	Telefon	Místnost	E-mail
Ing. Dagmar Herzánová	+420 532 290 482	408	[javascript protected email address]
Daniel Jadlovský	+420 532 290 390		[javascript protected email address]
Ing. Ivana Podstranská	+420 532 290 481	407	[javascript protected email address]
Jan Procházka	+420 532 290 390		[javascript protected email address]
Ing. Peter Smatana	+420 532 290 432	323	[javascript protected email address]

Číslo	Název	Řešitel
13-28685P	Identifikace mechanismů únavového poškození u moderních ocelí vyvíjených pro fúzní a jaderné reaktory	Ing. Ivo Kuběna, Ph.D.

VŠECHNY PROJEKTY

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