Cross Section Polisher SM-09010, JEOL
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.
The device produces cross sections of samples – hard, soft, or composites – without smearing, crumbling, distorting, or contaminating them in any way. It is especially used for studying thin layers on substrates or modified surface layers of materials, e.g. after nitriding or plasma spraying.