Institute of Physics of Materials AS CR, v. v. i. > Groups > Electron Microscopy
Talos™ F200i transmission electron microscope
Contact person: Ing. Ivo Kuběna, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscope
Contact person: Ing. Ivo Kuběna, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
MightyEBIC 2.0 (Ephemeron Labs)
Contact person: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIB
Contact person: Ing. Ivana Podstranská
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB
Contact person: Ing. Ivana Podstranská
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
SPM LiteScope (NenoVision)
Contact person: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
Transmission electron microscope Philips CM12 STEM
Contact person: Ing. Ivo Kuběna, Ph.D.
Analytical transmission electron microscope Philips CM12 STEM with thermoemission source of electrons.
Precision Ion Polishing System (PIPS) Gatan MODEL 691
Contact person: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing
Precision Ion Polishing System (PIPS II), Gatan MODEL 695
Contact person: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.
Cross Section Polisher SM-09010, JEOL
Contact person: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.
Nic nebylo nalezeno / nothing found
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Electron Microscopy
| Head | Ing. Ivo Kuběna, Ph.D. |
| [javascript protected email address] | |
| Phone number | +420 532 290 417 |
| Room | 316 |
The EM group takes care of the operation and maintenance of electron microscopes, the development of microscopic techniques and their successful applications for solving the research tasks. The group covers top quality transmission electron microscopy (TEM) specimen preparation by various techniques.
Secondary and backscattered electrons are used for basic imagining in scanning electron microscopes (SEM). Moreover, SEMs are equipped with various detectors. EDS or WDS detectors are used for chemical analysis and EBSD detector plays a key role in phase or texture analysis. Two focused ion columns (FIB) together with a gas injection system offer other possibilities. Ga ions can be used for imagining and deposition of thin layers or micromachining on the microscale. The FIB technique is, for example, frequently used for site-specific TEM specimen preparation.
Two TEMs with the atomic resolution are present at IPM. TEMs might be operated in standard TEM mode as well as in scanning mode (STEM). STEM using bright field and high angle angular dark field detector is an unreplaceable method in microstructural analysis. Both TEMs are equipped with EDS detectors for chemical analysis on a nanometric level. One TEM is equipped with a Lorentz lens and biprism for holography.
Members of the group are capable of specimen preparation and microstructure documentation and data processing and analysis via appropriate software. The members keep cooperating with companies producing microscopes on the development of advanced microscopic techniques and their modification for specific needs of the research taking place at IPM. The group belongs to an infrastructural part of the department of Experimental Studies and Modelling of Structure.
Secondary and backscattered electrons are used for basic imagining in scanning electron microscopes (SEM). Moreover, SEMs are equipped with various detectors. EDS or WDS detectors are used for chemical analysis and EBSD detector plays a key role in phase or texture analysis. Two focused ion columns (FIB) together with a gas injection system offer other possibilities. Ga ions can be used for imagining and deposition of thin layers or micromachining on the microscale. The FIB technique is, for example, frequently used for site-specific TEM specimen preparation.
Two TEMs with the atomic resolution are present at IPM. TEMs might be operated in standard TEM mode as well as in scanning mode (STEM). STEM using bright field and high angle angular dark field detector is an unreplaceable method in microstructural analysis. Both TEMs are equipped with EDS detectors for chemical analysis on a nanometric level. One TEM is equipped with a Lorentz lens and biprism for holography.
Members of the group are capable of specimen preparation and microstructure documentation and data processing and analysis via appropriate software. The members keep cooperating with companies producing microscopes on the development of advanced microscopic techniques and their modification for specific needs of the research taking place at IPM. The group belongs to an infrastructural part of the department of Experimental Studies and Modelling of Structure.
Technicians
| Name | Phone numbers | Rooms | |
|---|---|---|---|
| Markéta Gálíková | +420 532 290 344 | 116b | [javascript protected email address] |
| Ing. Dagmar Herzánová | +420 532 290 482 | 318 | [javascript protected email address] |
| Ing. Ivana Podstranská | +420 532 290 481 | 407 | [javascript protected email address] |
| Jan Procházka | +420 532 290 390 | [javascript protected email address] | |
| Ing. Peter Smatana | +420 532 290 432 | 323 | [javascript protected email address] |
| Project number | Name | Investigator |
|---|---|---|
| 13-28685P | Identification of fatigue damage mechanisms in modern steels under development for fusion and nuclear reactors | Ing. Ivo Kuběna, Ph.D. |
Talos™ F200i transmission electron microscopeContact person: Ing. Ivo Kuběna, Ph.D.
The Thermo Scientific™ Talos F200i TEM is a 20-200 kV transmission electron microscope with a field electron gun (FEG).
JEOL JEM-2100F transmission electron microscopeContact person: Ing. Ivo Kuběna, Ph.D.
JEOL JEM-2100F TEM is a multipurpose analytical electron microscope with field electron gun (FEG).
MightyEBIC 2.0 (Ephemeron Labs)Contact person: doc. Ing. Roman Gröger, Ph.D.
Scan controller and data acquisition interface for making quantitative Electron Beam Induced Current (EBIC) measurements.
Scanning electron microscope Tescan LYRA 3 XMH FEG/SEMxFIBContact person: Ing. Ivana Podstranská
Tescan LYRA 3 XMH FEG/SEM scanning electron microscope with a FEG electron source.
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIBContact person: Ing. Ivana Podstranská
Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB with FEG electron source.
SPM LiteScope (NenoVision)Contact person: doc. Ing. Roman Gröger, Ph.D.
Scanning Probe Microscope (SPM) designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. LiteScope incorporates a unique imaging technique "Correlative Probe and Electron Microscopy (CPEM)" enabling simultaneous acquisition of AFM and SEM data. LiteScope and the CPEM technology allow sample analysis in a way that was previously difficult or impossible by the two imaging technologies simultaneously.
Transmission electron microscope Philips CM12 STEMContact person: Ing. Ivo Kuběna, Ph.D.
Analytical transmission electron microscope Philips CM12 STEM with thermoemission source of electrons.
Precision Ion Polishing System (PIPS) Gatan MODEL 691Contact person: Ing. Dagmar Herzánová
The System for TEM samples preparation by argon ions polishing
Precision Ion Polishing System (PIPS II), Gatan MODEL 695Contact person: Ing. Dagmar Herzánová
The instrument designed to produce high-quality TEM specimens by argon ions polishing.
Cross Section Polisher SM-09010, JEOLContact person: Ing. Dagmar Herzánová
Preparation of cross sections of different materials using an argon ion beam for SEM investigation.
Nic nebylo nalezeno / nothing found
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