ESPI System Q-300 Dantec Dynamics
|Contact||Ing. Zdeněk Chlup, Ph.D.|
An Electronic Speckle Pattern Interferometry (ESPI) for high sensitive displacement and strain analysis.
The 3D ESPI System Q-300 enables complete three dimensional and highly sensitive deformation and strain analysis of any specimen or component.
The main parameters are as follows: measuring sensitivity adjustable from 0.03 to 1 µm, measuring range is adjustable to any range by variation of measurement steps (i.e., 10 - 100 µm per step depending on the measuring direction), measuring area up to 200 x 300 mm2 and operation modes can be automatic or manual and meassuremnets in 1D, 2D or 3D can be conducted.