Institute of Physics of Materials AS CR, v. v. i. > Projects > Next Generation of Integrated Atomic Force and Scanning Electron Microscopy (GEFSEM)

Next Generation of Integrated Atomic Force and Scanning Electron Microscopy (GEFSEM)

Co-investigatorprof. Ing. Luboš Náhlík, Ph.D.
Number of ProjectFW01010183
Internal Project Number102013
AgencyTechnologická agentura České republiky
Duration2020-04-01 - 2023-03-31

Anotace
The aim is to strengthen competitiveness and commercial potential of NenoVision's LiteScope on the international market with the help of next generation equipment and accessories. These innovations will focus on 4 areas that represent the project's sub-goals:
  1. Upgrade of hardware devices - development of new HW modules that allow sample rotation, cooling, heating and probe loading through Load-Lock of electron microscopes
  2. Software development of image analysis procedures which are obtained by multilevel correlation techniques
  3. Development of applications and examples of correlative techniques combining AFM/SEM with the use of newly developed hardware and software modules
  4. Cooperation between NenoVision and academic partners with transfer of experience, know-how and technology.