Institute of Physics of Materials AS CR, v. v. i. > List of facilities > Transmission electron microscope JEOL JEM-2100F

Transmission electron microscope JEOL JEM-2100F

High resolution transmission electron microscope JEOL JEM-2100F with FEG electron source.

Microscope has point-to-point resolution 0.23 nm, it is equipped with X-Max80 Oxford Instruments EDS detector for X-ray microanalysis with analytical system Aztec, HAADF and BF detectors for STEM mode, 8Mpix camera by Gatan and software Digital Micrograph.