Institute of Physics of Materials AS CR, v. v. i. > List of facilities > Digital indicator SYLVAC NANO
Digital indicator SYLVAC NANO

Digital indicator useful for metallographic preparation of samples with high precision thickness requirement (for small-punch testing samples or TEM foils).
- Range 12.5 mm
- Resolution 0.1 µm
- Error better than 1.8 µm
- Bluetooth data transfer