Institute of Physics of Materials AS CR, v. v. i. > List of facilities > Digital indicator SYLVAC NANO

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Digital indicator SYLVAC NANO

Digital indicator useful for metallographic preparation of samples with high precision thickness requirement (for small-punch testing samples or TEM foils).

• Range 12.5 mm
• Resolution 0.1 µm
• Error better than 1.8 µm
• Bluetooth data transfer