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Facilities
Transmission electron microscope JEOL JEM-2100F
Microscope has point-to-point resolution 0.23 nm, it is equipped with X-Max80 Oxford Instruments EDS detector for X-ray microanalysis with analytical system Aztec, HAADF and BF detectors for STEM mode, 8Mpix camera by Gatan and software Digital Micrograph.
Information leaflet
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central european institute of technology



H2020-MSCA-ITN-2014-ETN




Last update
21. 11. 2017