Scanning electron microscope Tescan LYRA 3 XMU FEG/SEMxFIB
Contact person: Ing. Ivo Kubìna, Ph.D.
This electron microscope is equipped also with a focussed ion beam column, micromanipulator and a gas injection system. It can work also in low vacuum mode. The device is equipped with X-Max80 EDS detector for X-ray microanalysis and EBSD detector by Oxford Instruments with Aztec control system.
Information leaflet
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central european institute of technology


Last update
19. 06. 2018